|
|
|
any methods used for the expressed purpose of testing integrated circuits. Examples include built-in self test (BIST), automatic test pattern generator (ATPG), static current test (), and boundary scan. [1994 National Technology Roadmap for Semiconductors]
|
|
See also: |
test strategies definition
choosing which techniques from those available that will be used as part of a specific chip design. [1994 National Technology Roadmap for Semiconductors]
TCP/IP definition
abbreviation for transmission control protocol/internet protocol; the standard accepted by the U.S. Department of Defense for governing information interchange and communications between host computers.
system definition
1 : an integrated whole, composed of diverse, interacting, specialized structures and subfunctions. 2 : an integrated structure of components and subsystems capable of performing, in aggregate, one or more specific functions. [SEMI F1-90]
test method definition
a definitive procedure for the identification, measurement, and evaluation of a material, product, system, or service that produces a test result. [ASTM D4392-87]
temperature coefficient curve definition
in regulator performance testing, a plot of set point versus temperature from which the temperature coefficient can be determined.
|
|
|
|